Publicaciones en las que colabora con CRISTINA MEDINA BAILÓN (13)

2018

  1. Impact of Strain on S/D tunneling in FinFETs: A MS-EMC study

    International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

  2. MS-EMC vs. NEGF: A comparative study accounting for transport quantum corrections

    2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2018

  3. Source-to-drain tunneling analysis in FDSOI, DGSOI, and FinFET devices by means of multisubband ensemble Monte Carlo

    IEEE Transactions on Electron Devices, Vol. 65, Núm. 11, pp. 4740-4746

2017

  1. Assessment of gate leakage mechanism utilizing Multi-Subband Ensemble Monte Carlo

    Joint International EUROSOl Workshop and International Conference on Ultimate Integration on Silicon-ULIS, EUROSOI-ULIS 2017 - Proceedings

  2. Confinement orientation effects in S/D tunneling

    Solid-State Electronics, Vol. 128, pp. 48-53

  3. Multi-subband ensemble Monte Carlo study of tunneling leakage mechanisms

    International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

2016

  1. Confinement orientation effects in S/D tunneling

    2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2016

  2. Impact of non uniform strain configuration on transport properties for FD14+ devices

    Solid-State Electronics, Vol. 115, pp. 232-236

  3. Multi-subband ensemble Monte Carlo study of band-to-band tunneling in silicon-based TFETs

    International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

2015

  1. Impact of S/D tunneling in ultrascaled devices, a Multi-Subband Ensemble Monte Carlo study

    International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

  2. Impact of non uniform strain configuration on transport properties for FD14+ devices

    EUROSOI-ULIS 2015 - 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon

  3. Sub-22nm scaling of UTB2SOI devices for Multi-Vt applications

    EUROSOI-ULIS 2015 - 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon