Universitat Rovira i Virgili-ko ikertzaileekin lankidetzan egindako argitalpenak (5)

2013

  1. Analytical Drain Current Model using Temperature dependence model in nanoscale Double-Gate (DG) MOSFETs

    2013 14TH INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (ULIS)

  2. Analytical drain current model using temperature dependence model in nanoscale Double-Gate (DG) MOSFETs

    ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day'