Universidade Federal do Rio Grande do Sul-ko ikertzaileekin lankidetzan egindako argitalpenak (2)

2024

  1. High-Temporal-Resolution Characterization Reveals Outstanding Random Telegraph Noise and the Origin of Dielectric Breakdown in h-BN Memristors

    Advanced Functional Materials, Vol. 34, Núm. 15

2022

  1. Hardware implementation of a true random number generator integrating a hexagonal boron nitride memristor with a commercial microcontroller

    Nanoscale, Vol. 15, Núm. 5, pp. 2171-2180