ROBERTO
PALMA GUERRERO
PROFESOR TITULAR DE UNIVERSIDAD
![Foto de Juan José](/img/nophoto.png)
Juan José
Gómez Cadenas
Publicacions en què col·labora amb Juan José Gómez Cadenas (13)
2015
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Ionization and scintillation of nuclear recoils in gaseous xenon
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 793, pp. 62-74
2014
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Characterization of a medium size Xe/TMA TPC instrumented with microbulk Micromegas, using low-energyγ-rays
Journal of Instrumentation, Vol. 9, Núm. 4
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Description and commissioning of NEXT-MM prototype: First results from operation in a Xenon-Trimethylamine gas mixture
Journal of Instrumentation, Vol. 9, Núm. 3
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Present status and future perspectives of the NEXT experiment
Advances in High Energy Physics, Vol. 2014
2013
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Design and characterization of the SiPM tracking system of NEXT-DEMO, a demonstrator prototype of the NEXT-100 experiment
Journal of Instrumentation, Vol. 8, Núm. 5
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Initial results of NEXT-DEMO, a large-scale prototype of the NEXT-100 experiment
Journal of Instrumentation, Vol. 8, Núm. 4
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Ionization and scintillation response of high-pressure xenon gas to alpha particles
Journal of Instrumentation, Vol. 8, Núm. 5
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Near-intrinsic energy resolution for 30-662 keV gamma rays in a high pressure xenon electroluminescent TPC
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 708, pp. 101-114
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Operation and first results of the NEXT-DEMO prototype using a silicon photomultiplier tracking array
Journal of Instrumentation, Vol. 8, Núm. 9
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Radiopurity control in the NEXT-100 double beta decay experiment
AIP Conference Proceedings
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Radiopurity control in the NEXT-100 double beta decay experiment: Procedures and initial measurements
Journal of Instrumentation, Vol. 8, Núm. 1
2012
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NEXT-100 technical design report (TDR). Executive summary
Journal of Instrumentation, Vol. 7, Núm. 6
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SiPMs coated with TPB: Coating protocol and characterization for NEXT
Journal of Instrumentation, Vol. 7, Núm. 2