Institut de Microélectronique, Electromagnétisme et Photonique-ko ikertzaileekin lankidetzan egindako argitalpenak (2)

2019

  1. Investigation of thin gate-stack Z2-FET devices as capacitor-less memory cells

    Solid-State Electronics, Vol. 159, pp. 12-18

  2. Temperature and Gate Leakage Influence on the Z2-FET Memory Operation

    European Solid-State Device Research Conference