Publicaciones en las que colabora con Theopisti Dafni (13)

2015

  1. Ionization and scintillation of nuclear recoils in gaseous xenon

    Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 793, pp. 62-74

2014

  1. Characterization of a medium size Xe/TMA TPC instrumented with microbulk Micromegas, using low-energyγ-rays

    Journal of Instrumentation, Vol. 9, Núm. 4

  2. Description and commissioning of NEXT-MM prototype: First results from operation in a Xenon-Trimethylamine gas mixture

    Journal of Instrumentation, Vol. 9, Núm. 3

  3. Present status and future perspectives of the NEXT experiment

    Advances in High Energy Physics, Vol. 2014

2013

  1. Design and characterization of the SiPM tracking system of NEXT-DEMO, a demonstrator prototype of the NEXT-100 experiment

    Journal of Instrumentation, Vol. 8, Núm. 5

  2. Initial results of NEXT-DEMO, a large-scale prototype of the NEXT-100 experiment

    Journal of Instrumentation, Vol. 8, Núm. 4

  3. Ionization and scintillation response of high-pressure xenon gas to alpha particles

    Journal of Instrumentation, Vol. 8, Núm. 5

  4. Near-intrinsic energy resolution for 30-662 keV gamma rays in a high pressure xenon electroluminescent TPC

    Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 708, pp. 101-114

  5. Operation and first results of the NEXT-DEMO prototype using a silicon photomultiplier tracking array

    Journal of Instrumentation, Vol. 8, Núm. 9

  6. Radiopurity control in the NEXT-100 double beta decay experiment

    AIP Conference Proceedings

  7. Radiopurity control in the NEXT-100 double beta decay experiment: Procedures and initial measurements

    Journal of Instrumentation, Vol. 8, Núm. 1

2012

  1. NEXT-100 technical design report (TDR). Executive summary

    Journal of Instrumentation, Vol. 7, Núm. 6

  2. SiPMs coated with TPB: Coating protocol and characterization for NEXT

    Journal of Instrumentation, Vol. 7, Núm. 2