Nanoscale aggregation phenomena at the contact line of air-drying pure water droplets on silicon revealed by atomic force microscopy

  1. Méndez-Vilas, A.
  2. Jódar-Reyes, A.B.
  3. Díaz, J.
  4. González-Martín, M.L.
Aldizkaria:
Current Applied Physics

ISSN: 1567-1739

Argitalpen urtea: 2009

Alea: 9

Zenbakia: 1

Orrialdeak: 48-58

Mota: Artikulua

DOI: 10.1016/J.CAP.2007.11.009 GOOGLE SCHOLAR
Datuen iturria: Scopus