A simple model to analyze electron confinement and trapping in silicon nanodots

  1. Villanueva, J.A.L.
  2. Tejada, J.A.J.
  3. Palma, A.
  4. Bolívar, S.R.
  5. Carceller, J.E.
Actes de conférence:
2005 Spanish Conference on Electron Devices, Proceedings

ISBN: 9780780388109

Année de publication: 2005

Volumen: 2005

Pages: 345-348

Type: Communication dans un congrès

DOI: 10.1109/SCED.2005.1504400 GOOGLE SCHOLAR