A qualitative study of the influence of confinement direction on phonon and interface roughness scattering in p-type FD/SOI devices
ISSN: 0038-1101
Argitalpen urtea: 2005
Alea: 49
Zenbakia: 9 SPEC. ISS.
Orrialdeak: 1454-1460
Mota: Biltzar ekarpena