Influence of the doping profile on electron mobility in a MOSFET

  1. Gamiz, F.
  2. Lopez-Villanueva, J.A.
  3. Roldan, J.B.
  4. Carceller, J.E.
Journal:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Year of publication: 1996

Volume: 43

Issue: 11

Pages: 2023-2025

Type: Article

DOI: 10.1109/16.543043 GOOGLE SCHOLAR
Data source: Scopus