Electron trapping and detrapping in near-interfacial traps during Fowler-Nordheim tunneling injection at 77 K

  1. López-Villanueva, J.A.
  2. Carceller, J.E.
  3. Gámiz, F.
  4. Banqueri, J.
Aldizkaria:
Microelectronic Engineering

ISSN: 0167-9317

Argitalpen urtea: 1995

Alea: 28

Zenbakia: 1-4

Orrialdeak: 317-320

Mota: Artikulua

DOI: 10.1016/0167-9317(95)00066-H GOOGLE SCHOLAR
Datuen iturria: Scopus