Accurate determination of majority thermal-capture cross sections of deep impurities in p-n junctions

  1. Palma, A.
  2. Jimenez-Tejada, J.A.
  3. Banqueri, J.
  4. Cartujo, P.
  5. Carceller, J.E.
Revue:
Journal of Applied Physics

ISSN: 0021-8979

Année de publication: 1993

Volumen: 74

Número: 4

Pages: 2605-2612

Type: Article

DOI: 10.1063/1.354673 GOOGLE SCHOLAR