Temperature and Gate Leakage Influence on the Z2-FET Memory Operation
- Marquez, C.
- Navarro, S.
- Navarro, C.
- Salazar, N.
- Galy, P.
- Cristoloveanu, S.
- Gamiz, F.
ISSN: 1930-8876
ISBN: 9781728115399
Year of publication: 2019
Volume: 2019-September
Pages: 238-241
Type: Conference paper