Temperature and Gate Leakage Influence on the Z2-FET Memory Operation

  1. Marquez, C.
  2. Navarro, S.
  3. Navarro, C.
  4. Salazar, N.
  5. Galy, P.
  6. Cristoloveanu, S.
  7. Gamiz, F.
Aktak:
European Solid-State Device Research Conference

ISSN: 1930-8876

ISBN: 9781728115399

Argitalpen urtea: 2019

Alea: 2019-September

Orrialdeak: 238-241

Mota: Biltzar ekarpena

DOI: 10.1109/ESSDERC.2019.8901803 GOOGLE SCHOLAR
Datuen iturria: Scopus