On the Low-Frequency Noise Characterization of Z2-FET Devices

  1. Marquez, C.
  2. Navarro, C.
  3. Navarro, S.
  4. Padilla, J.L.
  5. Donetti, L.
  6. Sampedro, C.
  7. Galy, P.
  8. Kim, Y.-T.
  9. Gamiz, F.
Journal:
IEEE Access

ISSN: 2169-3536

Year of publication: 2019

Volume: 7

Pages: 42551-42556

Type: Article

DOI: 10.1109/ACCESS.2019.2907062 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus