Z2-FET memory matrix in 28 nm FDSOI technology

  1. Parihar, M.S.
  2. Lee, K.H.
  3. Park, H.J.
  4. Navarro, C.
  5. Lacord, J.
  6. Gamiz, F.
  7. Galy, P.
  8. Cristoloveanu, S.
  9. Bawedin, M.
Actes de conférence:
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2018

ISBN: 9781538648117

Année de publication: 2018

Volumen: 2018-January

Pages: 1-4

Type: Communication dans un congrès

DOI: 10.1109/ULIS.2018.8354341 GOOGLE SCHOLAR
La source de données: Scopus