Z2-FET memory matrix in 28 nm FDSOI technology

  1. Parihar, M.S.
  2. Lee, K.H.
  3. Park, H.J.
  4. Navarro, C.
  5. Lacord, J.
  6. Gamiz, F.
  7. Galy, P.
  8. Cristoloveanu, S.
  9. Bawedin, M.
Actas:
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2018

ISBN: 9781538648117

Ano de publicación: 2018

Volume: 2018-January

Páxinas: 1-4

Tipo: Achega congreso

DOI: 10.1109/ULIS.2018.8354341 GOOGLE SCHOLAR
Fonte de datos: Scopus