Evaluation of thin-oxide Z2-FET DRAM cell

  1. Navarro, S.
  2. Lee, K.H.
  3. Marquez, C.
  4. Navarro, C.
  5. Parihar, M.
  6. Park, H.
  7. Galy, P.
  8. Bawedin, M.
  9. Gamiz, F.
  10. Cristoloveanu, S.
Proceedings:
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2018

ISBN: 9781538648117

Year of publication: 2018

Volume: 2018-January

Pages: 1-4

Type: Conference paper

DOI: 10.1109/ULIS.2018.8354342 GOOGLE SCHOLAR
Data source: Scopus