Assessment of confinement-induced band-To-band tunneling leakage in the FinEHBTFET

  1. Padilla, J.L.
  2. Alper, C.
  3. Gamiz, F.
  4. Ionescu, A.M.
Proceedings:
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2016

ISBN: 9781467386098

Year of publication: 2016

Pages: 20-23

Type: Conference paper

DOI: 10.1109/ULIS.2016.7440042 GOOGLE SCHOLAR
Data source: Scopus