Assessment of confinement-induced band-To-band tunneling leakage in the FinEHBTFET
- Padilla, J.L.
- Alper, C.
- Gamiz, F.
- Ionescu, A.M.
Actas:
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2016
ISBN: 9781467386098
Ano de publicación: 2016
Páxinas: 20-23
Tipo: Achega congreso