TCAD simulation of interface traps related variability in bulk decananometer mosfets

  1. Velayudhan, V.
  2. Martin-Martinez, J.
  3. Rodriguez, R.
  4. Porti, M.
  5. Nafria, M.
  6. Aymerich, X.
  7. Medina, C.
  8. Gamiz, F.
Proceedings:
2014 5th European Workshop on CMOS Variability, VARI 2014

ISBN: 9781479953998

Year of publication: 2014

Type: Conference paper

DOI: 10.1109/VARI.2014.6957078 GOOGLE SCHOLAR
Data source: Scopus