Influence of the interface trap location on the performance and variability of ultra-scaled MOSFETs

  1. Velayudhan, V.
  2. Gamiz, F.
  3. Martin-Martinez, J.
  4. Rodriguez, R.
  5. Nafria, M.
  6. Aymerich, X.
Revue:
Microelectronics Reliability

ISSN: 0026-2714

Année de publication: 2013

Volumen: 53

Número: 9-11

Pages: 1243-1246

Type: Communication dans un congrès

DOI: 10.1016/J.MICROREL.2013.07.052 GOOGLE SCHOLAR
La source de données: Scopus