Analytical drain current model using temperature dependence model in nanoscale Double-Gate (DG) MOSFETs
- Cheralathan, M.
- Sampedro, C.
- Gamiz, F.
- Iniguez, B.
Actes de conférence:
ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day'
ISBN: 9781467348003
Année de publication: 2013
Pages: 141-144
Type: Communication dans un congrès