Impact of back-gate biasing on effective field and mobility in ultrathin silicon-on-insulator metal-oxide-semiconductor field-effect-transistors

1. Ohata, A.
2. Rodriguez, N.
3. Navarro, C.
4. Donetti, L.
5. Gamiz, F.
6. Fenouillet-Beranger, F.C.
7. Cristoloveanu, S.