Contribution of the carrier number fluctuation and mobility fluctuation on the RTS amplitude in submicron n-MOSFETs

  1. Godoy, A.
  2. Palma, A.
  3. Gamiz, F.
  4. Jimenez-Tejada, J.A.
  5. Cartujo, P.
Proceedings:
Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations

Year of publication: 1997

Pages: 201-204

Type: Conference paper

GOOGLE SCHOLAR
Data source: Scopus