A closed-loop evaluation and validation of a method for determining the dependence of the electron mobility on the longitudinal-electric field in mosfet's

  1. Roldán, J.B.
  2. Gámiz, F.
  3. López-Villanueva, J.A.
Journal:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Year of publication: 1997

Volume: 44

Issue: 9

Pages: 1447-1453

Type: Article

DOI: 10.1109/16.622600 GOOGLE SCHOLAR
Data source: Scopus