A closed-loop evaluation and validation of a method for determining the dependence of the electron mobility on the longitudinal-electric field in mosfet's

  1. Roldán, J.B.
  2. Gámiz, F.
  3. López-Villanueva, J.A.
Revue:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Année de publication: 1997

Volumen: 44

Número: 9

Pages: 1447-1453

Type: Article

DOI: 10.1109/16.622600 GOOGLE SCHOLAR
La source de données: Scopus