Study of 1/f and generation-recombination noise in four gate transistors

  1. Luque Rodríguez, A.
  2. Jiménez Tejada, J.A.
  3. Marun González, M.
  4. Reverto Planes, M.
  5. López Varo, P.
  6. Godoy, A.
Aktak:
Proceedings of the IEEE 21st International Conference on Noise and Fluctuations, ICNF 2011

ISBN: 9781457701924

Argitalpen urtea: 2011

Orrialdeak: 283-286

Mota: Biltzar ekarpena

DOI: 10.1109/ICNF.2011.5994322 GOOGLE SCHOLAR