Localization and quantification of noise sources in four-gate field-effect-transistors

  1. Luque Rodríguez, A.
  2. Jiménez Tejada, J.A.
  3. Godoy, A.
  4. Ló pez Villanueva, J.A.
  5. Gó mez-Campos, F.M.
  6. Rodríguez-Bolivar, S.
Journal:
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields

ISSN: 0894-3370,  1099-1204

Year of publication: 2010

Volume: 23

Issue: 4-5

Pages: 285-300

Type: Conference paper

DOI: 10.1002/JNM.744 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus