Ge content and recess depth dependence of the band-to-band tunneling current in Si1-xGex/Si hetero-junctions
- Rodríguez, A.L.
- Tejada, J.A.J.
- Gonzalez, M.B.
- Eneman, G.
- Claeys, C.
- Simoen, E.
Konferenzberichte:
Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011
ISBN: 9781424478637
Datum der Publikation: 2011
Art: Konferenz-Beitrag