One cut‐point phase‐type distributions in reliability. An application to resistive random access memories
- Acal, C.
- Ruiz‐castro, J.E.
- Maldonado, D.
- Roldán, J.B.
Journal:
Mathematics
ISSN: 2227-7390
Year of publication: 2021
Volume: 9
Issue: 21
Type: Article