One cut‐point phase‐type distributions in reliability. An application to resistive random access memories

  1. Acal, C.
  2. Ruiz‐castro, J.E.
  3. Maldonado, D.
  4. Roldán, J.B.
Aldizkaria:
Mathematics

ISSN: 2227-7390

Argitalpen urtea: 2021

Alea: 9

Zenbakia: 21

Mota: Artikulua

DOI: 10.3390/MATH9212734 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus