Experimental study of the series resistance effect and its impact on the compact modeling of the conduction characteristics of HfO2-based resistive switching memories

1. Maldonado, D.
2. Aguirre, F.
3. González-Cordero, G.
4. Roldán, A.M.
5. González, M.B.
6. Jiménez-Molinos, F.
7. Campabadal, F.
8. Miranda, E.
9. Roldán, J.B.