Experimental study of the series resistance effect and its impact on the compact modeling of the conduction characteristics of HfO2-based resistive switching memories
- Maldonado, D.
- Aguirre, F.
- González-Cordero, G.
- Roldán, A.M.
- González, M.B.
- Jiménez-Molinos, F.
- Campabadal, F.
- Miranda, E.
- Roldán, J.B.
ISSN: 1089-7550, 0021-8979
Year of publication: 2021
Volume: 130
Issue: 5
Type: Article