Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks
- Maldonado, D.
- Roldan, J.B.
- Roldan, A.M.
- Jimenez-Molinos, F.
- Hui, F.
- Shi, Y.
- Jing, X.
- Wen, C.
- Lanza, M.
ISSN: 1541-7026
ISBN: 9781728131993
Year of publication: 2020
Volume: 2020-April
Type: Conference paper