Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks

1. Maldonado, D.
2. Roldan, J.B.
3. Roldan, A.M.
4. Jimenez-Molinos, F.
5. Hui, F.
6. Shi, Y.
7. Jing, X.
8. Wen, C.
9. Lanza, M.