An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors

  1. González, P.
  2. Ibáñez, M.J.
  3. Roldán, A.M.
  4. Roldán, J.B.
Journal:
Mathematics and Computers in Simulation

ISSN: 0378-4754

Year of publication: 2015

Volume: 118

Pages: 248-257

Type: Article

DOI: 10.1016/J.MATCOM.2014.11.018 GOOGLE SCHOLAR
Data source: Scopus