An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors

  1. González, P.
  2. Ibáñez, M.J.
  3. Roldán, A.M.
  4. Roldán, J.B.
Aldizkaria:
Mathematics and Computers in Simulation

ISSN: 0378-4754

Argitalpen urtea: 2015

Alea: 118

Orrialdeak: 248-257

Mota: Artikulua

DOI: 10.1016/J.MATCOM.2014.11.018 GOOGLE SCHOLAR
Datuen iturria: Scopus