Sensitivity of Unbiased Commercial P-channel Power VDMOSFETs to X-ray Radiation
- Ristic, G.S.
- Jevtic, A.S.
- Ilic, S.D.
- Dimitrijevic, S.
- Veljkovic, S.
- Palma, A.J.
- Stankovic, S.
- Andjelkovic, M.S.
Konferenzberichte:
Proceedings of the International Conference on Microelectronics, ICM
ISBN: 9781665445283
Datum der Publikation: 2021
Ausgabe: 2021-September
Seiten: 341-344
Art: Konferenz-Beitrag