Sensitivity of Unbiased Commercial P-channel Power VDMOSFETs to X-ray Radiation

  1. Ristic, G.S.
  2. Jevtic, A.S.
  3. Ilic, S.D.
  4. Dimitrijevic, S.
  5. Veljkovic, S.
  6. Palma, A.J.
  7. Stankovic, S.
  8. Andjelkovic, M.S.
Proceedings:
Proceedings of the International Conference on Microelectronics, ICM

ISBN: 9781665445283

Year of publication: 2021

Volume: 2021-September

Pages: 341-344

Type: Conference paper

DOI: 10.1109/MIEL52794.2021.9569096 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus