Backscattered electron imaging of cultured cells: Application to electron probe X-ray microanalysis using a scanning electron microscope
- Fernández-Segura, E.
- Cañizares, F.J.
- Cubero, M.A.
- Revelles, F.
- Campos, A.
ISSN: 0022-2720
Année de publication: 1997
Volumen: 188
Número: 1
Pages: 72-78
Type: Article