Highly Reliable Quadruple-Node Upset-Tolerant D-Latch

  1. Hatefinasab, S.
  2. Ohata, A.
  3. Salinas, A.
  4. Castillo, E.
  5. Rodriguez, N.
Revue:
IEEE Access

ISSN: 2169-3536

Année de publication: 2022

Volumen: 10

Pages: 31836-31850

Type: Article

DOI: 10.1109/ACCESS.2022.3160448 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus