Parameter extraction techniques for the analysis and modeling of resistive memories
- Maldonado, D.
- Aldana, S.
- González, M.B.
- Jiménez-Molinos, F.
- Campabadal, F.
- Roldán, J.B.
Journal:
Microelectronic Engineering
ISSN: 0167-9317
Year of publication: 2022
Volume: 265
Type: Review