Parameter extraction techniques for the analysis and modeling of resistive memories

  1. Maldonado, D.
  2. Aldana, S.
  3. González, M.B.
  4. Jiménez-Molinos, F.
  5. Campabadal, F.
  6. Roldán, J.B.
Journal:
Microelectronic Engineering

ISSN: 0167-9317

Year of publication: 2022

Volume: 265

Type: Review

DOI: 10.1016/J.MEE.2022.111876 GOOGLE SCHOLAR lock_openOpen access editor