Parameter extraction techniques for the analysis and modeling of resistive memories
- Maldonado, D.
- Aldana, S.
- González, M.B.
- Jiménez-Molinos, F.
- Campabadal, F.
- Roldán, J.B.
Revue:
Microelectronic Engineering
ISSN: 0167-9317
Année de publication: 2022
Volumen: 265
Type: Révision