Correction of Secondary Fluorescence across Phase Boundaries in Electron Probe Microanalysis of Mineral Inclusions

  1. Llovet, X.
  2. Proenza, J.A.
  3. Pujol-Solà, N.
  4. Farré-De-Pablo, J.
  5. Campeny, M.
Revue:
Microscopy and Microanalysis

ISSN: 1435-8115,  1431-9276

Année de publication: 2020

Volumen: 26

Número: 5

Pages: 895-905

Type: Article

DOI: 10.1017/S1431927620024393 GOOGLE SCHOLAR
La source de données: Scopus