Three-dimensional Multi-subband Simulation of Scaled FinFETs
- Donetti, L.
- Sampedro, C.
- Ruiz, F. G.
- Godoy, A.
- Gamiz, F.
ISSN: 1930-8876
ISBN: 978-1-5090-5978-2
Année de publication: 2017
Pages: 180-183
Congreso: 47th European Solid-State Device Research Conference (ESSDERC)
Type: Communication dans un congrès