Analytical Drain Current Model using Temperature dependence model in nanoscale Double-Gate (DG) MOSFETs
- Cheralathan, M.
- Sampedro, C.
- Gamiz, F.
- Iniguez, B.
ISSN: 2330-5738
ISBN: 978-1-4673-4802-7, 978-1-4673-4800-3
Year of publication: 2013
Pages: 142-145
Congress: 14th International Conference on Ultimate Integration on Silicon (ULIS)
Type: Conference paper