Ab initio validation of continuum models for Si/SiO2 interfaces

  1. Biel, Blanca
  2. Donetti, Luca
  3. Godoy, Andres
  4. Gamiz, Francisco J.
Book Series:
2013 14TH INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (ULIS)

ISSN: 2330-5738

ISBN: 978-1-4673-4802-7,  978-1-4673-4800-3

Year of publication: 2013

Pages: 166-169

Congress: 14th International Conference on Ultimate Integration on Silicon (ULIS)

Type: Conference paper

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Data source: WoS