Temperature and Gate Leakage Influence on the Z(2)-FET Memory Operation

  1. Marquez, C.
  2. Navarro, S.
  3. Navarro, C.
  4. Salazar, N.
  5. Galy, P.
  6. Cristoloveanu, S.
  7. Gamiz, F.
Book Series:
49TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2019)

ISSN: 1930-8876

ISBN: 978-1-7281-1539-9

Year of publication: 2019

Pages: 238-241

Congress: 49th European Solid-State Device Research Conference (ESSDERC)

Type: Conference paper

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Data source: WoS