Temperature and Gate Leakage Influence on the Z(2)-FET Memory Operation

  1. Marquez, C.
  2. Navarro, S.
  3. Navarro, C.
  4. Salazar, N.
  5. Galy, P.
  6. Cristoloveanu, S.
  7. Gamiz, F.
Liburu bilduma:
49TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2019)

ISSN: 1930-8876

ISBN: 978-1-7281-1539-9

Argitalpen urtea: 2019

Orrialdeak: 238-241

Biltzarra: 49th European Solid-State Device Research Conference (ESSDERC)

Mota: Biltzar ekarpena

GOOGLE SCHOLAR
Datuen iturria: WoS